The ease with which an internal circuit node can be driven to a specific logic value (0 or 1) from the external input pins.
The fundamental challenge of digital testing is summarized by two metrics:
Uses a Multiple-Input Signature Register (MISR) to compress the massive stream of output data into a single, unique hexadecimal value called a "signature." digital systems testing and testable design solution
The ability to set an internal node to a specific value (0 or 1) by applying inputs to the primary pins.
Without high controllability and observability, traditional testing requires millions of test vectors, driving up testing costs and time. Understanding Fault Modeling The ease with which an internal circuit node
Digital Systems Testing and Testable Design: A Comprehensive Guide to Solutions
ATPG is the algorithmic process of creating a set of input vectors that can distinguish a faulty circuit from a fault-free one. The two main algorithms are: driving up testing costs and time.
Multiplexers added to critical timing paths introduce minor propagation delays. Can slightly reduce the maximum achievable clock frequency.